Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard / edited by Adam Osseiran.

Contributor(s):

Material type:

TextLanguage: English Series: Frontiers in electronic testingPublication details: Boston : Kluwer Academic Publishers, 1999.Description: xviii, 155 p. : ill. ; 24 cmISBN:

Subject(s):

DDC classification:

Item type:

Books

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Books	Central Library, University of Rajshahi Reading Room		Non-fiction		621.381548 ANA 1999 (Browse shelf(Opens below))				C-1	Not For Loan	INR		B46203

Includes bibliographical references and index.

There are no comments on this title.

to post a comment.