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Multiple-beam interferometry of surfaces and films / by S. Tolansky.
Material type:
TextLanguage: English Publication details: New York : Dover Publications 1970Description: vi, 186 p. : ill. ; 22 cmISBN: - 0486622150
- 535.4 23 TOM 1970
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Central Library, University of Rajshahi | Non-fiction | 535.4 TOM 1970 (Browse shelf(Opens below)) | C-2 | Available | GBP | A85263 |
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