Thin-film and depth-profile analysis /
Thin-film and depth-profile analysis /
edited by H. Oechsner ; with contributions by H.W. Etzkorn ... [et al.].
- Berlin : New York : Springer-Verlag, c1984.
- 205 p. : ill. ; 23 cm.
Catalogong based on CIP information.
Includes bibliographical references and index.
0387133208 (U.S.)
Thin films--Surfaces.
Surface chemistry.
Sputtering (Physics)
530.41 / THI 1984
Catalogong based on CIP information.
Includes bibliographical references and index.
0387133208 (U.S.)
Thin films--Surfaces.
Surface chemistry.
Sputtering (Physics)
530.41 / THI 1984