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The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale /

Terman, Lewis M. 1877-1956.

The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / by Lewis M. Terman. - Boston : Houghton Mifflin Company, c1916. - xviii, 362 p. : ill. ; 20 cm. - Riverside textbooks in education . - Riverside textbooks in education .

Includes index.

Subjects--Topical Terms:
Intelligence tests.
Binet-Simon Test.

Dewey Class. No.: 150 / TEM 1916

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