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Pattern in organization analysis : a critical examination /

Krupp, Sherman Roy.

Pattern in organization analysis : a critical examination / Sherman Roy Krupp. - New York : Holt, Rinehart and Winston, Inc., 1961 [Reissued 1964]. - ix, 201 p. : 21 cm.

Includes bibliographical references and indexes.

Subjects--Topical Terms:
Industrial organization.
Industrial management.
Organization.

Dewey Class. No.: 658 / KRP 1964

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