Multiple-beam interferometry of surfaces and films / by S. Tolansky.
Material type:
TextLanguage: English Publication details: New York : Dover Publications 1970Description: vi, 186 p. : ill. ; 22 cmISBN: - 0486622150
- 535.4 23 TOM 1970
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
Central Library, University of Rajshahi | Non-fiction | 535.4 TOM 1970 (Browse shelf(Opens below)) | C-2 | Available | GBP | A85263 |
Include index
There are no comments on this title.
Log in to your account to post a comment.