000 01025nam a2200289 a 4500
001 73591
003 BD-RjUL
005 20211209082420.0
008 170604s1968 nyua b 001 0 eng
035 _a(BD-RjUL)73809
040 _aDLC
_cDLC
_dUKM
_dEQO
_dBD-RjUL
_beng
041 _aeng
082 0 0 _a621.3848
_223
_bMET 1968
100 1 _aCrispin, J. W.
_q(John W.)
_9217765
245 1 0 _aMethods of radar cross-section analysis /
_cby members of the staff of the Conductron Corporation: J. J. Bowman... [et. al.] edited by J. W. Crispin, Jr., and K. M. Siegel.
260 _aNew York :
_bAcademic Press,
_c1968.
300 _axiv, 426 p. :
_bill. ;
_c24 cm.
490 1 _aElectrical science
504 _aIncludes bibliographies.
650 0 _aRadar.
_9217766
650 0 _aRadar cross sections.
_9217767
700 1 _aSiegel, K. M.
_q(Keeve Milton),
_d1923-
_9217768
700 1 _aBowman, J. J.
_9217769
710 2 _aConductron Corporation.
_9217770
830 0 _aElectrical science series.
_9217772
942 _2ddc
_cBK
999 _c73591
_d73591