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| 008 | 170329s1949 nyua b 001 0 eng d | ||
| 035 | _a(BD-RjUL) 68048 | ||
| 040 |
_aDLC _cDLC _dBD-RjUL _beng |
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| 041 | _aeng | ||
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_a535.4 _223 _bTOM 1949 |
| 100 | 1 |
_aTolansky, S. _q(Samuel), _d1907- _9159148 |
|
| 245 | 1 | 0 |
_aMultiple-beam interferometry of surfaces and films / _cby S. Tolansky. |
| 260 |
_aOxford : _bAt The Clarendon Press, _c1949 |
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| 300 |
_avii,187 p. : _bill. ; _c22 cm. |
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| 504 | _aBibliography: p. 184. & Index. | ||
| 650 | 0 |
_aInterferometry. _9159149 |
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| 650 | 0 |
_aSurfaces (Technology) _9159150 |
|
| 650 | 0 |
_aMetallography. _9159151 |
|
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_2ddc _cBK |
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_c67839 _d67839 |
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