<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Central Library, University of Rajshahi Search for 'an:26879']]> </title> <!-- prettier-ignore-start --> <link> https://opac.ru.ac.bd/cgi-bin/koha/opac-search.pl?q=ccl=an%3A26879&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="https://opac.ru.ac.bd/cgi-bin/koha/opac-search.pl?q=ccl=an%3A26879&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'an:26879' at Central Library, University of Rajshahi]]> </description> <opensearch:totalResults>4</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>100</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://opac.ru.ac.bd/cgi-bin/koha/opac-search.pl?q=ccl=an%3A26879&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dan%253A26879" startPage="" /> <item> <title> Thin-film and depth-profile analysis / </title> <dc:identifier>ISBN:0387133208 (U.S.)</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8631</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0387133208.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Berlin : | New York : Springer-Verlag, 1984 .<br /> 205 p. : , Catalogong based on CIP information. 23 cm. .<br /> 0387133208 (U.S.) </p> ]]> <![CDATA[ <p> <a href="https://opac.ru.ac.bd/cgi-bin/koha/opac-reserve.pl?biblionumber=8631">Place hold on <em>Thin-film and depth-profile analysis /</em></a> </p> ]]> </description> <guid>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8631</guid> </item> <item> <title> Thin film phenomena / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8869</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Chopra, Kasturi L.,.<br /> New York : McGraw-Hill , 1969 .<br /> xx, 844 p. : 23 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.ru.ac.bd/cgi-bin/koha/opac-reserve.pl?biblionumber=8869">Place hold on <em>Thin film phenomena /</em></a> </p> ]]> </description> <guid>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8869</guid> </item> <item> <title> The use of thin films in physical investigations : a NATO Advanced Study Institute held at the Imperial College of Science and Technology, University of London, 19-24 July, 1965. / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8983</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> London ; | New York : Academic Press, 1966 .<br /> xix, 462 p. : 23 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.ru.ac.bd/cgi-bin/koha/opac-reserve.pl?biblionumber=8983">Place hold on <em>The use of thin films in physical investigations :</em></a> </p> ]]> </description> <guid>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8983</guid> </item> <item> <title> Physics of thin films : advances in research and development </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8992</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> New York, NY ; | London : Academic Press, 1966 .<br /> 3 v., xiii, 318 p. : 24 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.ru.ac.bd/cgi-bin/koha/opac-reserve.pl?biblionumber=8992">Place hold on <em>Physics of thin films :</em></a> </p> ]]> </description> <guid>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=8992</guid> </item> </channel> </rss>
