<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Central Library, University of Rajshahi Search for 'an:159150']]> </title> <!-- prettier-ignore-start --> <link> https://opac.ru.ac.bd/cgi-bin/koha/opac-search.pl?q=ccl=an%3A159150&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="https://opac.ru.ac.bd/cgi-bin/koha/opac-search.pl?q=ccl=an%3A159150&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'an:159150' at Central Library, University of Rajshahi]]> </description> <opensearch:totalResults>3</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>100</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="https://opac.ru.ac.bd/cgi-bin/koha/opac-search.pl?q=ccl=an%3A159150&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dan%253A159150" startPage="" /> <item> <title> Multiple-beam interferometry of surfaces and films / </title> <dc:identifier>ISBN:0486622150</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=53243</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0486622150.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Tolansky, S..<br /> New York : Dover Publications 1970 .<br /> vi, 186 p. : , Include index 22 cm..<br /> 0486622150 </p> ]]> <![CDATA[ <p> <a href="https://opac.ru.ac.bd/cgi-bin/koha/opac-reserve.pl?biblionumber=53243">Place hold on <em>Multiple-beam interferometry of surfaces and films /</em></a> </p> ]]> </description> <guid>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=53243</guid> </item> <item> <title> Surface and interfacial science : applications to engineering and technology / </title> <dc:identifier>ISBN:8173194645</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=67623</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8173194645.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Rastogi, M. C..<br /> New Delhi : Narosa Publishing house, 2003 .<br /> 542 p. : , Includes index 25 cm. .<br /> 8173194645 </p> ]]> <![CDATA[ <p> <a href="https://opac.ru.ac.bd/cgi-bin/koha/opac-reserve.pl?biblionumber=67623">Place hold on <em>Surface and interfacial science : </em></a> </p> ]]> </description> <guid>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=67623</guid> </item> <item> <title> Multiple-beam interferometry of surfaces and films / </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=67839</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Tolansky, S..<br /> Oxford : At The Clarendon Press, 1949 .<br /> vii,187 p. : 22 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="https://opac.ru.ac.bd/cgi-bin/koha/opac-reserve.pl?biblionumber=67839">Place hold on <em>Multiple-beam interferometry of surfaces and films /</em></a> </p> ]]> </description> <guid>https://opac.ru.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=67839</guid> </item> </channel> </rss>
