TY  - BOOK
AU  - Mueller, William M
ED  - Conference on Application of X-ray Analysis.
ED  - Denver Research Institute.
TI  - Advances in x-ray analysis: proceedings of the ... annual Conference on Application of X-ray Analysis 
U1  -  539.7222  23
PY  - 1960///
CY  - New York
PB  - Plenum Press
KW  - X-rays
KW  - Industrial applications
KW  - Congresses
KW  - Chemistry Techniques, Analytical
KW  - yearbooks
KW  - Radiography
N1  - V.1. -- v.2. -- v.3. -- v.4. --; Chemical abstracts; 0009-2258; Computer & control abstracts; 0036-8113
ER  -