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  <titleInfo>
    <title>Advances in x-ray analysis</title>
    <subTitle>proceedings of the ... annual Conference on Application of X-ray Analysis</subTitle>
  </titleInfo>
  <name type="conference">
    <namePart>Conference on Application of X-ray Analysis.</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
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  </name>
  <name type="personal">
    <namePart>Mueller, William M</namePart>
  </name>
  <name type="corporate">
    <namePart>Denver Research Institute</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <genre authority="marc">conference publication</genre>
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    <place>
      <placeTerm type="text">New York</placeTerm>
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    <publisher>Plenum Press</publisher>
    <dateIssued>1960</dateIssued>
    <issuance>monographic</issuance>
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  <language>
    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
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  <physicalDescription>
    <form authority="marcform">print</form>
    <extent> v. : ill. ; 26 cm.</extent>
  </physicalDescription>
  <tableOfContents>V.1. -- v.2. -- v.3. -- v.4. --</tableOfContents>
  <note type="statement of responsibility">edited by William M. Mueller and Marie Fay ; sponsored by University of Denver, Denver Research Institute.</note>
  <subject authority="lcsh">
    <topic>X-rays</topic>
    <topic>Industrial applications</topic>
    <topic>Congresses</topic>
  </subject>
  <subject authority="mesh">
    <topic>Chemistry Techniques, Analytical</topic>
    <topic>yearbooks</topic>
  </subject>
  <subject authority="mesh">
    <topic>Radiography</topic>
    <topic>yearbooks</topic>
  </subject>
  <classification authority="ddc" edition="23"> 539.7222  ADV 1960</classification>
  <relatedItem type="isReferencedBy">
    <note>Chemical abstracts 0009-2258.</note>
  </relatedItem>
  <relatedItem type="isReferencedBy">
    <note>Computer &amp; control abstracts 0036-8113.</note>
  </relatedItem>
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