Advances in x-ray analysis :  proceedings of the ... annual Conference on Application of X-ray Analysis / 
edited by William M. Mueller and Marie Fay ; sponsored by University of Denver, Denver Research Institute. 
 - New York :  Plenum Press,  1960 
 - v. :  ill. ;  26 cm. 
<br/><br/>V.1. -- v.2. -- v.3. -- v.4. -- 
<br/><br/> Chemical abstracts  0009-2258.  Computer & control abstracts  0036-8113. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-rays--Industrial applications--Congresses.<br/>Chemistry Techniques, Analytical--yearbooks.<br/>Radiography--yearbooks.
<br/><br/><label>Dewey Class. No.: </label>539.7222   / ADV 1960