00916nam a2200265 a 450000100060000000300080000600500170001400800410003103500190007204000370009104100080012808200270013610000300016324501760019326000390036930000340040849000230044250400290046565000110049465000260050570000420053170000180057371000280059183000310061973591BD-RjUL20211209082420.0170604s1968    nyua     b    001 0 eng    a(BD-RjUL)73809  aDLCcDLCdUKMdEQOdBD-RjULbeng  aeng00a621.3848223bMET 19681 aCrispin, J. W.q(John W.)10aMethods of radar cross-section analysis /cby members of the staff of the Conductron Corporation: J. J. Bowman... [et. al.] edited by J. W. Crispin, Jr., and K. M. Siegel.  aNew York :bAcademic Press,c1968.  axiv, 426 p. :bill. ;c24 cm.1 aElectrical science  aIncludes bibliographies. 0aRadar. 0aRadar cross sections.1 aSiegel, K. M.q(Keeve Milton),d1923-1 aBowman, J. J.2 aConductron Corporation. 0aElectrical science series.