Stochastic point processes: statistical analysis, theory, and applications. 
Peter A. W. Lewis, editor. 
 - New York :  Wiley-Interscience ;  [1972] 
 - xxii, 894 p. :  illus. ;  24 cm. 
 - Wiley series in probability and mathematical statistics .
<br/><br/> "Contains the bulk of the papers presented at a conference held at the IBM Research Center, Yorktown Heights, New York, on August 2-7, 1971." 
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>0471533505 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Point processes--Congresses.<br/>Analysis of variance--Congresses.
<br/><br/><label>Dewey Class. No.: </label>519.2  / STO