Analog and mixed-signal boundary-scan :  a guide to the IEEE 1149.4 test standard / 
edited by Adam Osseiran. 
 - Boston :  Kluwer Academic Publishers,  1999. 
 - xviii, 155 p. :  ill. ;  24 cm. 
 - Frontiers in electronic testing .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0792386868 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Printed circuits--Testing--Standards.<br/>Boundary scan testing.<br/>Mixed signal circuits--Testing.<br/>Electronic digital computers--Circuits--Design and construction.
<br/><br/><label>Dewey Class. No.: </label>621.381548  / ANA 1999