TY  - BOOK
AU  - Briggs,D.
AU  - Seah,M.P.
TI  - Practical surface analysis
SN  - 0471920819 (v. 1) :
U1  - 530.417 23
PY  - 1990///
CY  - Chichester, New York, Aarau
PB  - Wiley, Salle + Sauerländer
KW  - Surfaces (Technology)
KW  - Analysis
KW  - Electron spectroscopy
N1  - Includes bibliographical references and indexes; v. 1. Auger and X-ray photoelectron spectroscopy -- v. 2. Ion and neutral spectroscopy
ER  -