00911nam a2200265 a 450000100060000000300080000600500170001400800410003102000240007202000220009603500190011804000320013704100080016908200260017724500690020325000120027226000790028430000250036350400530038850500920044165000370053365000270057070000320059770000160062967946BD-RjUL20211209081720.0170329s1990    enka     b    001 0 eng    a0471920819 (v. 1) :  a0471920827 (v. 2)  a(BD-RjUL)68155  aDLCcDLCdDLCdBD-RjULbeng  aeng00223a530.417bPRA 199000aPractical surface analysis /cedited by D. Briggs and M.P. Seah.  a2nd ed.  aChichester ;aNew York :bWiley ;aAarau :bSalle + Sauerländer,cc1990.  av. :bill. ;c24 cm.  aIncludes bibliographical references and indexes.1 av. 1. Auger and X-ray photoelectron spectroscopy -- v. 2. Ion and neutral spectroscopy. 0aSurfaces (Technology)xAnalysis. 0aElectron spectroscopy.1 aBriggs, D.q(David),d1948-1 aSeah, M. P.