TY  - BOOK
AU  - Tolansky,S.
TI  - Multiple-beam interferometry of surfaces and films
SN  - 0486622150
U1  - 535.4 23
PY  - 1970///
CY  - New York
PB  - Dover Publications
KW  - Interferometry
KW  - Surfaces (Technology)
KW  - Metallography
N1  - Include index
ER  -