Tolansky, S.  1907- <br/><br/>
Multiple-beam interferometry of surfaces and films / 
by S. Tolansky. 
 - New York :  Dover Publications  1970 
 - vi, 186 p. :  ill. ;  22 cm. 
<br/><br/> Include index 
<br/><br/><label>ISBN: </label>0486622150 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Interferometry.<br/>Surfaces (Technology)<br/>Metallography.
<br/><br/><label>Dewey Class. No.: </label>535.4  / TOM 1970