Nelson, Wayne,  1936- <br/><br/>
Accelerated testing :   statistical models, test plans and data analyses /4 
Wayne Nelson. 
 - New Jersey :  John Wiley & sons,  c1990,2004 
 - xiii, 601 p. :  ill. ;  24 cm. 
<br/><br/>Includes Bibliography and index. 
<br/><br/><label>ISBN: </label>0471697362 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability (Engineering)--Statistical methods<br/>Failure time data analysis --Statistical methods.
<br/><br/><label>Dewey Class. No.: </label>519.5  / NEA 2004