00700nam a2200217 a 450000100060000000300080000600500170001400800410003102000160007203500200008804000270010804100080013508200260014310000230016924500750019226000530026730000350032050400390035565000640039470000240045852940BD-RjUL20211209075902.0161001s1988    njua     b    001 0 eng    a0134988663   a(BD-RjUL) 53060  aDLCcDLCdBD-RjULbeng  aeng00a621.395223bFEI 19881 aFeugate, Robert J.10aIntroduction to VLSI testing /cRobert J. Feugate , Steven M. McIntyre  aEnglewood Cliffs, N.J. :bPrentice Hall,cc1988.  axiii, 226 p. :bill. ;c24 cm.  aIncludes bibliographies and index. 0aIntegrated circuitsxVery large scale integrationxTesting.1 aMcIntyre, Steven M.