Krupp, Sherman Roy. <br/><br/>
Pattern in organization analysis :  a critical examination / 
Sherman Roy Krupp. 
 - New York :  Holt, Rinehart and Winston, Inc.,  1961 [Reissued 1964]. 
 - ix, 201 p. :  21 cm. 
<br/><br/>Includes bibliographical references and indexes. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Industrial organization.<br/>Industrial management.<br/>Organization.
<br/><br/><label>Dewey Class. No.: </label>658  / KRP 1964